Optoelectronic materials and devices : 5-7 September, 2006, Gwangju, South Korea. pp.63523L-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Gao, J. ; Aarnink, W. A.M. ; Coene, W. ; Gerritsma, G. J. ; Gijs, M. A. M. ; Hakkens, F. ; Reuvekamp, E. M. C. M. ; Rogalla, H.
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Heteroepitaxy of dissimilar materials : symposium held April 29-May 2, 1991, Anaheim, California, U.S.A.. pp.47-52, 1991. Pittsburgh, Pa.. Materials Research Society
Geoinformatics 2006 : Geospatial information technology : 28-29 October 2006, Wuhan, China. pp.64210I-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Gao, J. ; Jiang, Z. ; Deng, Z. ; Zhou, X. ; Zhang, R. ; Lv, J.
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Remote sensing and modeling of ecosystems for sustainability III : 14-16 August 2006, San Diego, California, USA. pp.62981Q-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Tan, L. ; Miles, R.N. ; Weinstein, M.G. ; Miller, R.A. ; Su, Q. ; Cui, W. ; Gao, J.
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Unattended ground sensor technologies and applications IV : 2-5 April 2002 Orland, USA. pp.91-98, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Fourth International Conference on Virtual Reality and Its Applications in Industry : 23-25 October 2003, Tianjin, China. pp.252-259, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Hegmann, F.A. ; Ostroverkhova, O. ; Gao, J. ; Barker, L. ; Tykwinski, R.R. ; Bullock, J.E. ; Anthony, J.E.
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Ultrafast Phenomena in Semiconductors and Nanostructure Materials VIII. pp.196-207, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering