1.

Conference Proceedings
Conference Proceedings
1. Electromigration Failure Modes in CU Metallization*
Gall, M. ; Capasso, C. ; Thrasher, S. ; Zhao, L. ; Muiski, P. ; Hernandez, R. ; Herrick, M. ; Angyal, M. ; Boeck, B. ; Kawasaki, H.
Pub. info.: ULSI Process Integration : proceedings of the International Symposium.  pp.410-425,  2001.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-2
2.

Conference Proceedings
Conference Proceedings
2. Diffusional Void Growth in Dual-Inlaid Cu Interconnects
Jawarani, D. ; Gall, M. ; Capasso, C. ; Clark, G. ; Hernandez, R. ; Kawasaki, H.
Pub. info.: Interconnect and contact metallization for ULSI : proceedings of the international symposium.  pp.198-205,  1999.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-31
3.

Conference Proceedings
Conference Proceedings
3. Statistical Modeling and Experimental Verification of Electromigration Time to Fail Distribution in Metal Interconnects
Capasso, C. ; Gall, M. ; Anderson, S. ; Jawarani, D. ; Hernandez, R. ; Kawasaki, H.
Pub. info.: Proceedings of the Symposium on Interconnect and Contact Metallization.  pp.196-202,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-31
4.

Conference Proceedings
Conference Proceedings
4. Statistical Evaluation of Stressmigration Reliability in Al-Cu Interconnects
Jawarani, D. ; Gall, M. ; Capasso, C. ; Muller, J. ; Hernandez, R. ; Kawasaki, H.
Pub. info.: Materials reliability in microelectronics VIII : symposium held April 13-16, 1998, San Francisco, California, U.S.A..  pp.65-,  1998.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 516
5.

Conference Proceedings
Conference Proceedings
5. Statistical Analysis of Electromigration Lifetimes and Void Evolution for Cu Interconnects
Hauschildt, M. ; Gall, M. ; Thrasher, S. ; Justison, P. ; Michaelson, L. ; Hernandez, R. ; Kawasaki, H. ; Ho, P.S.
Pub. info.: Materials, technology and reliability for advanced interconnects and low-k dielectrics - 2004 : symposium held April 13-15, 2004, San Francisco, California, U.S.A..  pp.379-384,  2004.  Warrendale.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 812
6.

Conference Proceedings
Conference Proceedings
6. GRAIN BOUNDARY DIFFUSION IN NiFe/Ag BILAYER THIN FILMS
Gall, M. ; Pellerin, J. G. ; Ho, P. S. ; Coffey, K. R. ; Howard, J. K.
Pub. info.: Polycrystalline thin films : structure, texture, properties, and applications : symposium held April 4-8, 1994, San Francisco, California, U.S.A..  pp.217-,  1994.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 343
7.

Technical Paper
Technical Paper
7. Tuning the Standard SC Rreaction Kinetics to Model NO Conversion a Diesel Engine Exhaust SCR Catalyst System under Steady State Conditions in 1D and 3D Geometries Using Ammonia Gas as the Reductant.
Benjamin, S.F. ; Gall, M.
Pub. info.: 2012 SAE International Powertrains, Fuels & Lubricants Meeting : technical paper.  2012.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2012
8.

Conference Proceedings
Conference Proceedings
8. Development of high power high brightness fiber coupled diode laser systems [6104-22]
Ostrom, N. P. ; Gall, M. ; Faircloth, B. O.
Pub. info.: High-Power Diode Laser Technology and Applications IV.  pp.61040N-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6104