Sallagoity, P. ; Gaillard, F. ; Rivoire, M. ; Paoli, M. ; Brouquet, P. ; Haond, M. ; McClathie, S. ; Beekmann, K. ; Kiermasz, A. ; Dobson, C.
Pub. info.:
ULSI science and technology, 1997 : proceedings of the Sixth International Symposium on Ultralarge Scale Integration Science and Technology. pp.453-466, 1997. Pennington, NJ. Electrochemical Society
Remiat, B. ; Fusalba, F. ; Maury, P. ; Jousseaume, V. ; Lecornec, C. ; Gaillard, F. ; Durand, J.
Pub. info.:
Copper interconnects, new contact metallurgies, structures, and low-k interlevel dielectrics : proceedings of the internatioal symposium. pp.120-125, 2002. Pennington, N.J.. Electrochemical Society
Advanced organic solid state materials : symposium held November 27-December 2, 1989, Boston, Massachusetts, U.S.A.. pp.359-362, 1990. Pittsburgh, Pa.. Materials Research Society
Remiat, B ; Fusalba, F. ; Maury, P. ; Jousseaume, V ; Lecornec, C. ; Gaillard, F. ; Durand, I.
Pub. info.:
Thin film materials, processes, and reliability, plasma processing for the 100 nm node and copper interconnects with low-k inter-level dielectric films : proceedings of the international symposium. pp.14-19, 2003. Pennington, N.J.. Electrochemical Society
Clergereaux, R. ; Escaich, D. ; Martin, S. ; Raynaud, P. ; Gaillard, F.
Pub. info.:
New materials for microphotonics : symposium held April 13-15, 2004, San Francisco, California, U.S.A.. pp.167-172, 2004. Warrendale, Pa.. Materials Research Society