Search records | 東京工業大学附属図書館文献データベース

Sort order

3 results

Conference Proceedings

1. Radiation induced leakage due to stochastic charge trapping in isolation layers of nanoscale MOSFETs

G. I. Zebrev ; M. S. Gorbunov ; V. S. Pershenkov

Pub. info.:	Micro- and nanoelectronics 2007 : 1-5 October 2007, Zvenigorod, Russia. pp.702517-1-702517-8, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	7025

Conference Proceedings

2. Graphene nanoelectronics: electrostatics and kinetics

G. I. Zebrev

Pub. info.:	Micro- and nanoelectronics 2007 : 1-5 October 2007, Zvenigorod, Russia. pp.70250M-1-70250M-9, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	7025

Conference Proceedings

3. Parasitic bipolar effect in modern SOI CMOS technologies

V. E. Shunkov ; M. S. Gorbunov ; G. I. Zebrev ; B. V. Vasilegin

Pub. info.:	Micro- and nanoelectronics 2007 : 1-5 October 2007, Zvenigorod, Russia. pp.702516-1-702516-8, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	7025