Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo -Electronic Technology, and Artificial Intelligence : 13-15 October 2006, Beijing, China. pp.635743-1-635743-7, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical transmission, switching, and subsystems VI. 1 pp.713628-1-713628-5, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
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Proceedings of SPIE - the International Society for Optical Engineering
Fourth International Symposium on Precision Mechanical Measurements. 1 pp.71300W-1-71300W-6, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
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Proceedings of SPIE - the International Society for Optical Engineering
M. Kamp ; H. Scherer ; K. Janiak ; H. Heidrich ; R. Brenot ; G. Duan ; H. Benisty ; A. Forchel
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Integrated optics : devices, materials, and technologies XI : 22-24 January 2007, San Jose, California, USA. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering