1.

Conference Proceedings
Conference Proceedings
1. 'Recovery' Effect of Electron Induced Damage in 4H-SiC Schottky Diodes
Castaldini, A. ; Cavallini, A. ; Rigutti, L. ; Nava, F. ; Fuochi, P.G. ; Vanni, P.
Pub. info.: Radiation effects and ion-beam processing of materials : symposium held December 1-5, 2003, Boston, Massachusetts, U.S.A..  pp.611-616,  2004.  Warrendale, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 792
2.

Conference Proceedings
Conference Proceedings
2. Electron-Induced Damage Effects in 4H-SiC Schottky Diodes
Castaldini, A. ; Cavallini, A. ; Nava, F. ; Fuochi, P.G. ; Vanni, P.
Pub. info.: Silicon carbide and related materials 2002 : ECSCRM2002, proceedings of the 4th European Conference on Silicon Carbide and Related Materials, September 2-5, 2002, Linköping, Sweden.  pp.439-442,  2003.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 433-436