1.

Conference Proceedings
Conference Proceedings
1. STRESSES IN GATE LEVEL INTERCONNECTS OF WSi2 and TaSi2
Townsend, P.H. ; Fulks, R.T. ; Vander Plas, H.A. ; Ho, J.
Pub. info.: Materials issues in silicon integrated circuit processing : symposium held April 15-18, 1986, Palo Alto, California, U.S.A..  pp.395-402,  1986.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 71
2.

Conference Proceedings
Conference Proceedings
2. INITIAL NUCLEATION AND THE EFFECTS ON EPITAXIAL SILICIDE FORMATION
Nemanich, R.J. ; Doland, C.M. ; Fulks, R.T. ; Ponce, F.A.
Pub. info.: Thin films : interfaces and phenomena : symposium held December 2-6, 1985, Boston, Massachusetts, USA.  pp.255-260,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 54
3.

Conference Proceedings
Conference Proceedings
3. Scanned electron beam annealing of boron-implanted diodes
Yep, T.O. ; Fulks, R.T. ; Powell, R.A.
Pub. info.: Laser and electron-beam solid interactions and materials processing : proceedings of the Materials Research Society Annual Meeting, November 1980, Copley Plaza Hotel, Boston, Massachusetts, U.S.A..  pp.345-352,  1981.  New York.  North Holland
Title of ser.: Materials Research Society symposia proceedings
Ser. no.: 1