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14 results

Conference Proceedings

1. Polarization property of light-gated phase conjugation in methyl-orange-doped polymer film

Stato,T. ; Narita,H. ; Nakagawa,K. ; Fujiwara,H.

Pub. info.:	Optical engineering for sensing and nanotechnology (ICOSN 2001) : 6-8 June 2001, Yokohama, Japan. pp.408-411, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4416

Conference Proceedings

2. Flatness measurement by UV moire

Fujiwara,H. ; Otani,Y. ; Yoshizawa,T.

Pub. info.:	Optomechatronic systems II : 29-31 October 2001, Newton, USA. pp.323-330, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4564

Conference Proceedings

3. Lasing emission from a random medium composed of thulium-ion-doped glass particles and titanium dioxide powders

Fujiwara,H. ; Sasaki,K.

Pub. info.:	Optical engineering for sensing and nanotechnology (ICOSN 2001) : 6-8 June 2001, Yokohama, Japan. pp.190-193, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4416

Conference Proceedings

4. The Mt.Fuji submillimeter-wave telescope

Sekimoto,Y. ; Arikawa,Y. ; Aso,Y. ; Fujiwara,H. ; Ikeda,M. ; Inatani,J. ; Ito,T. ; Iwata,M. ; Kamegai,K. ; Maezawa,H. ; Noguchi,T. ; Ohishi,M. ; Oka,T. ; Ozeki,H. ; Saito,S. ; Sakai,T. ; Shi,S.-C. ; Tatematsu,K. ; Yamamoto,S.

Pub. info.:	Radio telescopes : 27 - 30 March 2000 Munich, Germany. pp.185-196, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4015

Conference Proceedings

5. Upconversion lasing of a Tm3+-doped fluoride glass microsphere

Sasaki,K. ; Fujiwara,H.

Pub. info.:	18th Congress of the International Commission for Optics : Optics for the next millennium : 2-6 August, 1999, San Francisco, California. pp.266-267, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3749

Conference Proceedings

6. Femtosecond Time-Resolved Spectroscopy for Lattice Relaxation Processes of Holes and Electron-Hole Pairs in Halide Crystals:The Dynamical Features

Tanimura,K. ; Fujiwara,H.

Pub. info.:	Proceedings of the 13th International Conference on Defects in Insulating Materials, ICDIM 96, July 15-19, 1996, Wake Forest University, Winston-Salem, NC 27109, USA. pp.549-554, 1997. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	239-241

Conference Proceedings

7. Femtosecond Spectroscopic Study for the Self-Trapping Process of Holes in Alkali Halides

Fujiwara,H. ; Suzuki,T. ; Tanimura,K.

Pub. info.:	Proceedings of the 13th International Conference on Defects in Insulating Materials, ICDIM 96, July 15-19, 1996, Wake Forest University, Winston-Salem, NC 27109, USA. pp.561-564, 1997. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	239-241

Conference Proceedings

8. Anisotropic ECR Plasma Etching with Low-Energy Ions

Tobinaga,Y. ; Miyano,T. ; Fujimoto,K. ; Fujito,M. ; Fujiwara,H.

Pub. info.:	Plasma properties, deposition and etching. pp.39-54, 1993. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	140-142

Conference Proceedings

9. Impurity Behavior during Si Single Crystal Growth from the Melt

Izumi,T. ; Morita,H. ; Fujiwara,T. ; Fujiwara,H. ; Inami,S.

Pub. info.:	Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995. pp.109-114, 1995. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	196-201

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Conference Proceedings

10. Growth Parameters Determining the Type of Grown-in Defects in Czochralski Silicon Crystals

Hourai,M. ; Kajita,E. ; Nagashima,T. ; Fujiwara,H. ; Sadamitsu,S. ; Miki,S. ; Shigematsu,T.

Pub. info.:	Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995. pp.1713-1718, 1995. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	196-201

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Author: Fujiwara,H.