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21 results

Conference Proceedings

1. High-performance absolute optical encoder using M-code

Matsuzoe,Y. ; Nakayama,T. ; Tsuji,N. ; Fujita,K. ; Yoshizawa,T.

Pub. info.:	Optomechatronic systems II : 29-31 October 2001, Newton, USA. pp.280-289, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4564

Conference Proceedings

2. Model experiments of fast ignition with coaxial high-power laser beams

Fujita,K. ; Sunahara,A. ; Tanada,K.A. ; Izumi,N. ; Jitsuno,T. ; Miyanaga,N. ; Miyakoshi,T. ; Otani,H. ; Fukao,M. ; Heya,M. ; Ochi,Y. ; Kitagawa,Y. ; Kodama,R. ; Mima,K. ; Nishimura,H. ; Norimatsu,T. ; Sentoku,Y. ; Takabe,H. ; Yamanaka,T.

Pub. info.:	ECLIM 2000 : 26th European Conference on Laser Interaction with Matter, 12-16 June, 2000, Prague, Czech Republic. pp.37-44, 2000. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4424

Conference Proceedings

3. CSP Packaging and Mounting Technologies for Mobile Apparatus

Kimura,T. ; Yamaji,Y. ; Juso,H. ; Ohara,Y. ; Matsune,Y. ; Miyata,K. ; Sota,Y. ; Narai,A. ; Fujita,K. ; Kada,M.

Pub. info.:	Proceedings : 1997 International Symposium on Microelectronics : 14-16 October 1997, Pennsylvania Convention Center Philadelphia, Pennsylvania. pp.256-261, 1997. Reston, VA. IMAPS
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3235

Conference Proceedings

4. Real-time Ca ion wave imaging in living rat cardiac muscle cells by a confocal multiphoton microscope with a microlens-pinhole array scanner

Fujita,K. ; Kaneko,T. ; Nakamura,O. ; Oyamada,M. ; Takamatsu,T. ; Kawata,S.

Pub. info.:	Optical diagnostics of living cells III : 24-25 January 2000, San Jose, California. pp.305-312, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3921

Conference Proceedings

5. Real-time confocal two-photon fluorescence microscope using a rotating microlens array

Fujita,K. ; Kaneko,T. ; Nakamura,O. ; Oyamada,M. ; Takamatsu,T. ; Kawata,S.

Pub. info.:	Optical engineering for sensing and nanotechnology (ICOSN '99) : 16-18 June 1999, Yokohama, Japan. pp.390-393, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3740

Conference Proceedings

6. High-performance encoder using the encoder model in a computer

Matsuzoe,Y. ; Fujita,K. ; Tsuji,N.

Pub. info.:	Optical engineering for sensing and nanotechnology (ICOSN '99) : 16-18 June 1999, Yokohama, Japan. pp.128-131, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3740

Conference Proceedings

7. Bragg peak shifts of fiber Bragg gratings in radiation environment

Fujita,K. ; Kimura,A. ; Nakazawa,M. ; Takahashi,H.

Pub. info.:	Fiber optic sensor technology II : 6-8 November 2000, Boston, USA. pp.184-191, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4204

Conference Proceedings

8. Self-Modulating Incorporation of Sb in Si/SiGe Superlatuces during Molecular Beam Epitaxial Growth

Fujita,K. ; Fukatsu,S. ; Usami,N. ; Yaguchi,H. ; Shiraki,Y. ; Ito,R.

Pub. info.:	Shallow Impurities in Semiconductors : Proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors "Physics and Control of Impurities", International Conference Center Kobe, Japan, 5 to 8 August, 1992. pp.159-164, 1993. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	117-118

Conference Proceedings

9. Erbium Doping to P-Based III-V Semiconductors by OMVPE with TBP as a Non-Toxic P Source

Fujiwara,Y. ; Ito,Y. ; Nonogaki,Y. ; Matsubara,N. ; Fujita,K. ; Takeda,Y.

Pub. info.:	Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995. pp.621-626, 1995. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	196-201

10.

Conference Proceedings

10. Effects of Activation Annealing on Thermally Stimulated Current in Semi-Insulating LEC GaAs Substrates

Yoshida,H. ; Kiyama,M. ; Takebe,T. ; Yamashita,M. ; Fujita,K.

Pub. info.:	Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995. pp.243-248, 1995. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	196-201

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