1.

Conference Proceedings

Conference Proceedings
Luzzi, D.E. ; Mori, H. ; Fujita,H. ; Meshii, M.
Pub. info.: Materials problem solving with the transmission electron microscope : symposium held December 2-4, 1985, Boston, Massachusetts, U.S.A..  pp.323-328,  1986.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 62
2.

Conference Proceedings

Conference Proceedings
Fujita,H.
Pub. info.: Micromachining and microfabrication process technology VII : 22-24 October 2001, San Francisco, USA.  pp.11-17,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4557
3.

Conference Proceedings

Conference Proceedings
Fujita,H.
Pub. info.: Optical measurement systems for industrial inspection II : application in industrial design : 18-19 June 2001 Munch, Germany.  pp.98-105,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4398
4.

Conference Proceedings

Conference Proceedings
Kitagawa,Y. ; Kodama,R. ; Tanaka,K.A. ; Tohyama,Y. ; Akamatsu,S. ; Sentoku,Y. ; Fujita,H. ; Jitsuno,T. ; Nishimura,H. ; Sakabe,S. ; Izawa,Y. ; Mima,K. ; Yamanaka,T.
Pub. info.: Charged particle detection, diagnostics, and imaging : 30 July - 2 August 2001 San Diego, USA.  pp.1-11,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4510
5.

Conference Proceedings

Conference Proceedings
Chen,J. ; Endo,J. ; Niino,Y. ; Fujita,H.
Pub. info.: Optical engineering for sensing and nanotechnology (ICOSN 2001) : 6-8 June 2001, Yokohama, Japan.  pp.158-161,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4416
6.

Conference Proceedings

Conference Proceedings
Yoshizawa,T. ; Takahashi,H. ; Yamamoto,M. ; Otani,Y. ; Fujita,H.
Pub. info.: Optical measurement systems for industrial inspection II : application in industrial design : 18-19 June 2001 Munch, Germany.  pp.199-206,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4398
7.

Conference Proceedings

Conference Proceedings
Kmetik,V. ; Yoshida,H. ; Fujita,H. ; Nakatsuka,M. ; Yamanaka,T.
Pub. info.: Advanced high-power lasers : 1-5 November 1999, Osaka, Japan.  pp.818-826,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3889
8.

Conference Proceedings

Conference Proceedings
Saiki,T. ; Bontoux,T. ; Miyanaga,N. ; Fujita,H. ; Yoshida,H. ; Sakamoto,T. ; Nakatsuka,M. ; Kanabe,T. ; Nakai,S.
Pub. info.: Advanced high-power lasers : 1-5 November 1999, Osaka, Japan.  pp.861-866,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3889
9.

Conference Proceedings

Conference Proceedings
Yoshida,H. ; Fujita,H. ; Nakatsuka,M. ; Yoshida,K.
Pub. info.: Advanced high-power lasers : 1-5 November 1999, Osaka, Japan.  pp.812-817,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3889
10.

Conference Proceedings

Conference Proceedings
Bourbon,G. ; Minotti,P. ; Helin,P. ; Fujita,H.
Pub. info.: Design, characterization, and packaging for MEMS and microelectronics : 27-29 October 1999, Royal Pines Resort, Queensland, Australia.  pp.501-510,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3893