1.

Conference Proceedings

Conference Proceedings
Fujii,A. ; Wada,H. ; Shibata,K. ; Nakayama,S. ; Hasegawa,M.
Pub. info.: Window and dome technologies and materials VII : 16-17 April 2001, Orlando, USA.  4375  pp.206-217,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4375
2.

Conference Proceedings

Conference Proceedings
Wada,H. ; Shibata,K. ; Yamashita,M. ; Nakayama,S. ; Fujii,A.
Pub. info.: Window and dome technologies and materials VII : 16-17 April 2001, Orlando, USA.  4375  pp.79-89,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4375
3.

Conference Proceedings

Conference Proceedings
Matsuoka,G. ; Saton,H. ; Fujii,A. ; Mizuno,K. ; Nakahara,T. ; Asai,S. ; Kadowaki,Y. ; Shimada,H. ; Touda,H. ; Iizumi,K. ; Takahashi,H. ; Oonuki,K. ; Kawahara,T. ; Kawasaki,K. ; Nagata,K.
Pub. info.: 21st Annual BACUS Symposium on Photomask Technology.  4562  pp.45-55,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4562
4.

Conference Proceedings

Conference Proceedings
Fujii,A. ; Mizuno,K. ; Nakahara,T. ; Asai,S. ; Kadowaki,Y. ; Shimada,H. ; Touda,H. ; Iizumi,K. ; Takahashi,H. ; Oonuki,K. ; Kawahara,T. ; Kawasaki,K. ; Nagata,K. ; Satoh,H.
Pub. info.: Photomask and Next-Generation Lithography Mask Technology VIII.  4409  pp.258-269,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4409
5.

Conference Proceedings

Conference Proceedings
Kudou,T. ; Ohyama,H. ; Vanhellemont,J. ; Simoen,E. ; Claeys,C. ; Takami,Y. ; Fujii,A. ; Sunaga,H.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.1217-1222,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
6.

Conference Proceedings

Conference Proceedings
Shkunov,M.N. ; Gellermann,W. ; Fujii,A. ; Yoshino,K. ; Vardeny,Z.V.
Pub. info.: Optical probes of conjugated polymers : 28-30 July 1997, San Diego, California.  pp.88-94,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3145
7.

Conference Proceedings

Conference Proceedings
Tada,K. ; Hidayat,R. ; Hirohata,M. ; Kajii,H. ; Tatsuhara,S. ; Fujii,A. ; Ozaki,M. ; Teraguchi,M. ; Masuda,T. ; Yoshino,K.
Pub. info.: Optical probes of conjugated polymers : 28-30 July 1997, San Diego, California.  pp.171-178,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3145
8.

Conference Proceedings

Conference Proceedings
Hirano,Y. ; Fujii,A. ; Tsunoi,K. ; Baba,S.
Pub. info.: Proceedings : 1997 International Symposium on Microelectronics : 14-16 October 1997, Pennsylvania Convention Center Philadelphia, Pennsylvania.  pp.250-255,  1997.  Reston, VA.  IMAPS
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3235
9.

Conference Proceedings

Conference Proceedings
Yoshino,K. ; Hirohata,M. ; Tada,K. ; Fujii,A. ; Ozaki,M. ; Naka,A. ; Ishikawa,M.
Pub. info.: Optical probes of conjugated polymers : 28-30 July 1997, San Diego, California.  pp.192-199,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3145
10.

Conference Proceedings

Conference Proceedings
Fujii,A. ; Shkunov,M.N. ; Vardeny,Z.V. ; Tada,K. ; Yoshino,K. ; Teraguchi,M. ; Masuda,T.
Pub. info.: Optical probes of conjugated polymers : 28-30 July 1997, San Diego, California.  pp.533-543,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3145