1.

Conference Proceedings
Conference Proceedings
1. The application of the Monte Carlo method in the design of probe of non-invasive measurement of blood glucose [6040-64]
Wang W. ; Fu G. ; Hou H. ; Gao M.
Pub. info.: ICMIT 2005: mechatronics, MEMS, and smart materials : 20-23 September 2005, Changchun, China.  pp.60401S-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6040
2.

Conference Proceedings
Conference Proceedings
2. Comparative analysis of photoluminescence in nano-sized amorphous and crystalline silicon embedded in silicon nitride thin film [6029-18]
Ding W. ; Yu W. ; Zhang J. ; Yang Y. ; Fu G.
Pub. info.: ICO20 : materials and nanostructures : 21-26 August, 2005, Changchun, China.  pp.60290I-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6029
3.

Conference Proceedings
Conference Proceedings
3. Substrate bias effect on preparation of nanocrystalline silicon carbide thin films in helicon wave plasma chemical vapor depostion [6029-34]
Yu W. ; Lu W. ; Wang C. ; Ding W. ; Fu G.
Pub. info.: ICO20 : materials and nanostructures : 21-26 August, 2005, Changchun, China.  pp.60290Y-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6029
4.

Conference Proceedings
Conference Proceedings
4. Thermal annealing effects on the optical properties of amorphous silicon carbide films deposited by pulsed laser ablation [6029-39]
Yu W. ; Lu W. ; Zhang L. ; Sun Y. ; Fu G.
Pub. info.: ICO20 : materials and nanostructures : 21-26 August, 2005, Changchun, China.  pp.602913-602913,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6029
5.

Conference Proceedings
Conference Proceedings
5. Research of unsymmetrical intrinsic Fabry-Perot fiber optic strain sensor [6019-47]
Zhang Y. ; Qi Y. ; Fu G. ; Bi W.
Pub. info.: Passive Components and Fiber-based Devices II.  pp.60191A-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6019
6.

Conference Proceedings
Conference Proceedings
6. Effect of radio frequency bias on the optical and structural properties of nanocrystalline SiC films deposited by helicon wave plasma enhanced chemical vapor deposition [6020-122]
Yu W. ; Wang C. ; Lu W. ; Cui S. ; Fu G.
Pub. info.: Optoelectronic Materials and Devices for Optical Communications.  pp.60203D-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6020
7.

Conference Proceedings
Conference Proceedings
7. Effects of magnetic field on the structural and optical properties of nanocrystalline silicon thin films deposited by helicon wave plasma chemical vapor deposittion [6020-121]
Yu W. ; Zhang L. ; Wang B. ; Han X. ; Sun W. ; Fu G.
Pub. info.: Optoelectronic Materials and Devices for Optical Communications.  pp.60203C-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6020
8.

Conference Proceedings
Conference Proceedings
8. Photoluminescene properties of hydrogenated amorphous silicon nitride thin films deposited by helicon wave plasma chemical vapor deposition [6020-123]
Fu G. ; Yu W. ; Lu W. ; Zhu H. ; Zhang L. ; Ding W.
Pub. info.: Optoelectronic Materials and Devices for Optical Communications.  pp.60203E-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6020