1.

Conference Proceedings
Conference Proceedings
1. Si Nanoparticle Synthesis and Self-Organization
Fowlkes, J.D. ; Pedraza, A.J.
Pub. info.: Quantum confined semiconductor nanostructures : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A..  pp.607-1228,  2003.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 737
2.

Conference Proceedings
Conference Proceedings
2. Ultraviolet Emitting SrS:Te Thin Films
Fitz-Gerald, J.M. ; Hoekstra, J. ; Fowlkes, J.D. ; Rack, P.D.
Pub. info.: Progress in semiconductors II : electronic and optoelectronic applications : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A..  pp.119-130,  2003.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 744
3.

Conference Proceedings
Conference Proceedings
3. Generation and manipulation of nanostructures by pulsed-laser ablation (Invited Paper)
Pedraza, A.J. ; Fowlkes, J.D. ; Guan, Y.
Pub. info.: High-Power Laser Ablation IV.  Part One  pp.164-174,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4760
4.

Conference Proceedings
Conference Proceedings
4. Laser-promoted nanostructure evolution and nanoparticle alignment (Invited Paper)
Pedraza, A.J. ; Fowlkes, J.D. ; Jesse, S. ; Guan, Y.
Pub. info.: Photon Processing in Microelectronics and Photonics II.  pp.156-167,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4977
5.

Conference Proceedings
Conference Proceedings
5. Soft electron beam etching for precision TEM sample preparation
Rack, P.D. ; Thesen, A. ; Randolph, S. ; Fowlkes, J.D. ; Joy, D.C.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVII.  2  pp.943-949,  2003.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5038