1.

Conference Proceedings
Conference Proceedings
1. A Survey of Defects in Strained Si Layers
Bedell, S.W. ; Chen, H. ; Sadana, D.K. ; Fogel, K. ; Domenicucci, A.
Pub. info.: High-mobility group-IV materials and devices : symposium held April 13-15, 2004, San Francisco, California, U.S.A..  pp.39-44,  2004.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 809
2.

Conference Proceedings
Conference Proceedings
2. Characterization of ultra thin SOI and SSOI substrates: defect and strain analysis Invited
Bedell, S.W. ; Hovel, H. ; Domenicucci, A. ; Fogel, K. ; Reznicek, A. ; Sadana, D.K.
Pub. info.: Silicon-on-insulator technology and devices XII : proceedings of the international symposium.  pp.345-356,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-03
3.

Conference Proceedings
Conference Proceedings
3. Strain Engineering for Si CMOS Technology (Invited paper)
Sadana, D. K. ; Bedell, S. W. ; Reznicek, A. ; de Souza, J.P. ; Fogel, K. ; Hovel, H.
Pub. info.: ULSI Process Integration : proceedings of the International Symposium.  pp.360-384,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-06