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Conference Proceedings

1. Metal Vacancies in Li and In Doped ZnSe and CdS

Wolf,H. ; Hornauer,U. ; Lermen,R. ; Edalamaw,Y. ; Filz,T. ; Krings,Th. ; Lauer,St. ; Ott,U. ; Singer,E. ; Tsige,M. ; Wichert,Th.

Pub. info.:	Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993. Pt.1 pp.459-464, 1994. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	143-147

Conference Proceedings

2. Metal Vacancies in Li and In Doped ZnSe and CdS

Wolf,H. ; Homauer,U. ; Lermen,R. ; Edalamaw,Y. ; Filz,T. ; Krings,Th. ; Lauer,St. ; Ott,U. ; Singer,E. ; Tsige,M. ; Wichert,Th.

Pub. info.:	Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993. Pt.1 pp.391-396, 1994. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	143-147

Conference Proceedings

3. Intrinsic Defects in ZnSe,ZnTe and CdS Doped with Li

Wolf,H. ; Jost,A. ; Lermen,R. ; Filz,T. ; Ostheimer,V. ; Wichert,Th.

Pub. info.:	Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995. pp.321-326, 1995. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	196-201

Conference Proceedings

4. Doping of ZnSe,ZnTe and CdTe with Group V Elements

Wolf,H. ; Burchard,A. ; Deicher,M. ; Filz,T. ; Jost,A. ; Lauer,St. ; Magerle,R. ; Ostheimer,V. ; Pfeiffer,W. ; Wichert,Th.

Pub. info.:	Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995. pp.309-314, 1995. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	196-201