Terahertz and gigahertz photonics : 19-23 July 1999, Denver, Colorado. pp.528-541, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Terahertz and gigahertz photonics : 19-23 July 1999, Denver, Colorado. pp.542-550, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Terahertz and gigahertz electronics and photonics II : 31 July - 2 August 2000, San Diego, USA. pp.171-181, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Terahertz and gigahertz electronics and photonics II : 31 July - 2 August 2000, San Diego, USA. pp.182-191, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Biomedical optics and lasers : diagnostics and treatment : 16-18 September 1998, Beijing, China. pp.212-216, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Smart structures and materials 2001 : smart electronics and MEMS : 5-7 March, 2001, Newport Beach, USA. pp.129-136, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Applications and science of computational intelligence II : 5-8 April 1999, Orlando, Florida. pp.486-493, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
International Conference on Fiber Optics and Photonics: Selected Papers from Photonics India '96. pp.138-142, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Microelectronic Manufacturing Yield, Reliability, and Failure Analysis. pp.204-213, 1995. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering