Yang, W. ; Zhao, D. ; Huang, Q. ; Ren, P. ; Feng, J. ; Zhang, X.
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Electronic imaging and multimedia technology IV : 8-11 November 2004, Beijing, China. pp.684-692, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Smart structures and materials 2005 : Modeling, signal processing, and control : 7-9 March 2005, San Diego, California, USA. pp.564-574, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Smart structures and materials 2005 : Modeling, signal processing, and control : 7-9 March 2005, San Diego, California, USA. pp.553-563, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
ANTEC '99 Conference proceedings, New York City, May 2-6, 1999 : plastics bridging the millennia. 2 pp.2766-2769, 1999. Brookfield Center, CT. Society of Plastics Engineers, Inc. (SPE)
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Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
Design, fabrication, and characterization of photonic devices : 27-30 November 2001, Singapore. pp.380-384, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
MacDiarmid, A. G. ; Zhou, Y. ; Feng, J. ; Furst, G. T. ; Shedlow, A. M.
Pub. info.:
ANTEC '99 Conference proceedings, New York City, May 2-6, 1999 : plastics bridging the millennia. 2 pp.1563-1567, 1999. Brookfield Center, CT. Society of Plastics Engineers, Inc. (SPE)
Title of ser.:
Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
Metro and access networks : APOC 2001, Asia-Pacific optical and wireless communications, 12-15 November 2001, Beijing, China. pp.272-279, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering