1.

Conference Proceedings

Conference Proceedings
Liu,B. ; Yang,L. ; Fan,J. ; Zhang,J.
Pub. info.: Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II : 29-30 January 1998, San Jose, California.  pp.15-17,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3275
2.

Conference Proceedings

Conference Proceedings
Liu,B. ; Fan,J. ; Yang,L. ; Wang,Q.
Pub. info.: Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II : 29-30 January 1998, San Jose, California.  pp.9-14,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3275
3.

Conference Proceedings

Conference Proceedings
Yi,Y. ; Wang,P. ; Fan,J. ; Lou,S. ; Chen,X. ; Xia,Y.
Pub. info.: Advanced photonic sensors : Technology and applications, 8-10 Novenber 2000, Beijing, China.  pp.139-143,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4220
4.

Conference Proceedings

Conference Proceedings
Fan,J. ; Yau,D.K.Y. ; Hacid,M.-S. ; Elmagarmid,A.K.
Pub. info.: Storage and retrieval for media databases 2001 : 24-26 January 2001, San Jose, USA.  pp.523-535,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4315
5.

Conference Proceedings

Conference Proceedings
Tian,C. ; Fan,J. ; Wang,W. ; Zhang,X. ; Yang,J.
Pub. info.: Instruments for optics and optoelectronic inspection and control, 8-10 November 2000, Beijing, China.  pp.243-246,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4223
6.

Conference Proceedings

Conference Proceedings
Fan,J. ; Fujita,G. ; Yu,J. ; Miyanohana,K. ; Onoye,T. ; Ishiura,N. ; Wu,L. ; Shirakawa,I.
Pub. info.: Electronic imaging and multimedia systems II : 18-19 September, 1998, Beijing, China.  pp.141-151,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3561
7.

Conference Proceedings

Conference Proceedings
Fan,J. ; Wang,Q. ; Zheng,X. ; Zhou,J.
Pub. info.: Computer-aided design and computer graphics : Fourth International Conference on Computer-Aided Design and Computer Graphics : 23-25 October, 1995, Wuhan, China.  pp.69-74,  1996.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2644
8.

Conference Proceedings

Conference Proceedings
Yang,W. ; Jia,Y. ; Jing,T. ; Shi,W. ; Hou,S. ; Wang,C. ; Xiang,Y. ; Fan,J. ; Lu,P. ; Ma,S. ; Xu,C.
Pub. info.: Integrated Optoelectronics.  pp.229-233,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2891
9.

Conference Proceedings

Conference Proceedings
Ma,S. ; Li,Y. ; Zheng,J. ; Fan,J. ; Xu,M. ; Li,D. ; Wu,B.
Pub. info.: Integrated Optoelectronics.  pp.218-220,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2891
10.

Conference Proceedings

Conference Proceedings
He,D. ; Fan,J. ; Fan,X.
Pub. info.: Integrated Optoelectronics.  pp.199-200,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2891