Pushing the Performance Limits of SiGe HBT Technology
- Author(s):
- Publication title:
- SiGe and Ge, materials, processing, and devices
- Title of ser.:
- ECS transactions
- Ser. no.:
- 3(7)
- Pub. Year:
- 2006
- Page(from):
- 341
- Page(to):
- 353
- Pages:
- 13
- Pub. info.:
- Pennington, N.J.: Electrochemical Society
- ISSN:
- 19385862
- ISBN:
- 9781566775076 [1566775078]
- Language:
- English
- Call no.:
- E23400/3-7
- Type:
- Conference Proceedings
Similar Items:
Electrochemical Society |
SPIE - The International Society of Optical Engineering |
2
Conference Proceedings
SiGe Selective Epitaxy: Morphology and Thickness Control for High Performance CMOS Technology
Electrochemical Society |
Electrochemical Society |
Electrochemical Society |
9
Conference Proceedings
Performance limits analysis of an analog fiber optic link for 3GPP W-CDMA systems
SPIE-The International Society for Optical Engineering |
4
Conference Proceedings
Investigating the differences in low-frequency noise behavior of npn and pnp SiGe HBTs fabricated in a complementary SiGe HBT BiCMOS on SOI technology
SPIE - The International Society of Optical Engineering |
10
Conference Proceedings
Comparison of low-frequency noise in III-V and Si/SiGe HBTs (Invited Paper)
SPIE-The International Society for Optical Engineering |
Electrochemical Society |
11
Conference Proceedings
Mn and Fe ions and oxo clusters in ZSM-5: pushing the limits of X-ray spectroscopy
Elsevier |
Materials Research Society |
SPIE - The International Society of Optical Engineering |