Blank Cover Image

Long-wave IR chemical sensing based on difference frequency generation in orientation-patterned GaAs

Author(s):
Bisson, S. E. ( Sandia National Labs.(USA) )
Kulp, T. L.
Bambha, R.
Armstrong, K.
Levi, O. ( Stanford Univ.(USA) )
Pinguet, T.
Eyres, L. A.
Fejer, M. M.
Harris, J. S.
4 more
Publication title:
Methods for ultrasensitive detection ll : 21-22 January 2002, San Jose, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4634
Pub. Year:
2002
Page(from):
78
Page(to):
82
Pages:
5
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819443731 [0819443735]
Language:
English
Call no.:
P63600/4634
Type:
Conference Proceedings

Similar Items:

Bisson, S.E., Kulp, T.J., Levi, O., Harris, J., Fejer, M.M.

SPIE - The International Society of Optical Engineering

Aniolek,K.W., Kulp,T.J., Richman,B.A., Bisson,S.E., Powers,P.E., Schmitt,R.L.

SPIE - The International Society for Optical Engineering

Vodopyanov, K.L., Levi, O., Kuo, P.S., Pinguet, T.J., Harris, J.S., Fejer, M.M., Gerard, B., Becouarn, L., Lallier, E.

SPIE - The International Society of Optical Engineering

Ludowise,P.D., Ottesen,D.K., Kulp,T.J., Goers,U.B, Celina,M., Armstrong,K., Allendorf,S.W.

SPIE - The International Society for Optical Engineering

Vodopyanov, K. L., Levi, O., Kuo, P. S., Pinguet, T. J., Harris, J. S., Fejer, M. M., Gerard, B., Becouarn, L., Lallier, …

SPIE - The International Society of Optical Engineering

S. E. Bisson, R. W. Crocker, T. J. Kulp, T. A. Reichardt, P. T. A. Reilly

Society of Photo-optical Instrumentation Engineers

K. L. Vodopyanov, J. E. Schaar, P. S. Kuo, M. M. Fejer, X. Yu, J. S. Harris, V. G. Kozlov, D. F. Bliss, C. Lynch

SPIE - The International Society of Optical Engineering

Scaccabarozzi, L., Wang, Z., Yu, X., Lau, W.T., Yanik, M.F., Fan, S., Fejer, M.M., Harris, J.S. Jr.

SPIE - The International Society of Optical Engineering

Yu, X., Scaccabarozzi, L., Lin, A. C., Fu, J., Kuo, P. S., Fejer, M. M., Harris, J. S.

SPIE - The International Society of Optical Engineering

Chui C. H., Martinet L. E., Fejer M. M., Harris Jr. S. J.

Kluwer Academic Publishers

Vodopyanov, K. L., Schaar, J., Fejer, M. M., Yu, X., Harris, J. S., Lee, Y. -S., Kozlov, V. G., Imeshev, G., Fermann, M. …

SPIE - The International Society of Optical Engineering

Oomens,J., Bisson,S.E., Harting,M., Kulp,T.J., Harren,F.J.M.

SPIE - The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12