1.

Conference Proceedings
Conference Proceedings
1. MODELING OF MBE GROWTH WITH INTERACTING FLUXES
Tomich, David H. ; Eyink, K.G. ; Haas, T.W. ; Capano, M.A. ; Kaspi, R. ; Cooley, W.T.
Pub. info.: Infrared detectors : materials, processing, and devices : symposium held April 14-16, 1993, San Francisco, California, U.S.A..  pp.9-14,  1994.  Pittsburgh, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 299
2.

Conference Proceedings
Conference Proceedings
2. Evaluating and Improving SIMS Method for Measuring Nitrogen in SiC
Smith, H.E. ; Eyink, K.G. ; Mitchel, W.C. ; Wood, M.C. ; Fanton, M.A.
Pub. info.: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.617-620,  2006.  Stafa-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 527-529
3.

Conference Proceedings
Conference Proceedings
3. Surface Passivation for Low-Temperature UHV Wafer Bonding of GaAs Substrates
Hesse, P.J. ; Haas, T.W. ; Lampert, W.V. ; Eyink, K.G. ; Tomich, D.H. ; Seaford, M.L.
Pub. info.: Semiconductor wafer bonding : science, technology, and applications : proceedings of the international symposia.  pp.244-258,  1999.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-35
4.

Conference Proceedings
Conference Proceedings
4. Characterization and Modeling of GaAs/AlGaAs P-Type Multi-Quantum Wells for Infared Detection at Normal Incidence
Brown, G.J. ; Taferner, W.T. ; Hedge, S.M. ; Eyink, K.G. ; Szmulowicz, F. ; Mitchel, W.C. ; Solomon, J. ; Walck, S.D.
Pub. info.: Proceedings of the Fifth International Symposium on Long Wavelength Infrared Detectors and Arrays: Physics and Applications.  pp.240-253,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-33