1.

Conference Proceedings
Conference Proceedings
1. * Characterization of ultra-thin Gate Dielectrics by Grazing X-Ray Reflectance and Spectroscopic Ellipsometry on the Same Instrument
Boher, P. ; Stehle, J.L. ; Defranoux, C. ; Bourtault, S. ; Piel, J.P. ; Evrard, P.
Pub. info.: Rapid thermal and other short-time processing technologies II : proceedings of the international symposium.  pp.67-78,  2001.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-9
2.

Conference Proceedings
Conference Proceedings
2. A NEW VARIABLE ANGLE FT-IR ELLIPSOMETER
Stehle, J. L. ; Thomas, O. T. ; Piel, J. P. ; Evrard, P. ; Lecat, J. H. ; Hammond, L. C.
Pub. info.: Polymer based molecular composites : symposium held November 27-30, 1989, Boston, Massachusetts, U.S.A..  pp.349-354,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 171
3.

Conference Proceedings
Conference Proceedings
3. Characterization of High-k Dielectrics by Combined Spectroscopic Ellipsometry (SE) and X-Ray Reflectometry (XRR)
Sun, L. ; Defranoux, C. ; Stehle, J. L. ; Boher, P. ; Evrard, P. ; Bellandi, E. ; Bender, H.
Pub. info.: Fundamentals of novel oxide/semiconductor interfaces : symposium held December 1-4, 2003, Boston, Massachusetts, U.S.A..  pp.95-102,  2004.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 786