1.

Conference Proceedings

Conference Proceedings
Deck, L. L. ; Evans, C.
Pub. info.: Advances in metrology for x-ray and EUV optics : 2-3 August 2005, San Diego, California, USA.  pp.59210A-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5921
2.

Conference Proceedings

Conference Proceedings
Song, J. ; Evans, C. ; McGlauflin, M. ; Whitenton, E. ; Vorburger, T. ; Yuan, Y.
Pub. info.: Scattering and surface roughness II : 21-23 July 1998, San Diego, California.  pp.213-221,  1998.  Bellingham, Wash..  SPIE
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3426
3.

Conference Proceedings

Conference Proceedings
Rowlands, N. ; Aldridge, D. ; Allen, R. ; Evans, C. ; Gregory, P. ; Hartwig, E. ; Mackay, B. ; Metcalfe, J. ; Richardson, G. ; Caldwell, D. ; Deschambault, R. ; Girard, T. ; Hackett, J. ; Henry, D. ; Hutchings, J. B. ; Morbey, C. ; Murowinski, R. ; Doyon, R. ; Alexander, R.
Pub. info.: Optical, infrared, and millimeter space telescopes : 21-25 June 2004, Glasgow, Scotland, United Kingdom.  pp.664-675,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5487
4.

Conference Proceedings

Conference Proceedings
Davila, P. S. ; Bos, B. J. ; Contreras, J. ; Evans, C. ; Greenhouse, M. A. ; Hobbs, G. ; Holota, W. ; Huff, L. W. ; Hutchings, J. B. ; Jamieson, T. H. ; Lightsey, P. A. ; Morbey, C. ; Murowinski, R. ; Rieke, M. J. ; Rowiands, N. ; Steakley, B. ; Wells, M. ; le Plate, M. B. ; Wright, G. S.
Pub. info.: Optical, infrared, and millimeter space telescopes : 21-25 June 2004, Glasgow, Scotland, United Kingdom.  pp.611-627,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5487
5.

Conference Proceedings

Conference Proceedings
Doyon, R. ; LaFreniere, D. ; Rowlands, N. ; Evans, C. ; Murowinski, R. ; Hutchings, J. B. ; Alexander, R.
Pub. info.: Optical, infrared, and millimeter space telescopes : 21-25 June 2004, Glasgow, Scotland, United Kingdom.  pp.746-753,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5487
6.

Conference Proceedings

Conference Proceedings
Rowlands, N. ; Evans, C. ; Greenberg, E. ; Gregory, P. ; Scott, A. ; Thibault, S. ; Poirier, M. ; Doyon, R. ; Hutchings, J. B. ; Alexander, R.
Pub. info.: Optical, infrared, and millimeter space telescopes : 21-25 June 2004, Glasgow, Scotland, United Kingdom.  pp.676-687,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5487
7.

Technical Paper

Technical Paper
Mickle, E. ; Evans, C.
Pub. info.: AIAA meeting papers on disc.  2005.  [Reston, Va.].  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : U.S. Air Force T&E Days
Ser. no.: 2005
8.

Technical Paper

Technical Paper
Mees, H. ; Evans, C. ; Iregbu, S. ; Keer, T.
Pub. info.: 2004 SAE world congress : technical paper.  2004.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2004
9.

Technical Paper

Technical Paper
Evans, C. ; Chiras, N. ; Guillaume, P. ; Rees, D.
Pub. info.: A.S.M.E. paper.  2001.  New York, NY.  American Society of Mechanical Engineers
Title of ser.: ASME Technical Paper : GT
Ser. no.: 2001
10.

Technical Paper

Technical Paper
Evans, C. ; Landi, B. ; Raffaelle, R. ; Krainsky, I. ; Bailey, S. ; Landis, G.
Pub. info.: AIAA meeting papers on disc.  2004.  [Reston, Va.].  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : International Energy Conversion Engineering Conference and Exhibit (IECEC)
Ser. no.: 2nd