1.

Conference Proceedings
Conference Proceedings
1. GaAs HEMT Reliability and Degradation Mechanisms after Long Term Stress Testing
Erica A. Douglas ; David Cheney ; Ke Hung Chen ; Chih-Yang Chang ; Lii-Cherng Leu ; Brent P. Gila ; Cammy R. Abernathy ; Stephen J. Pearton
Pub. info.: Reliability and materials issues of semiconductor optical and electrical devices and materials : symposium held November 29 - December 3, Boston, Massachusetts, U.S.A..  pp.151-160,  2010.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 1195
2.

Conference Proceedings
Conference Proceedings
2. A Comprehensive Approach to HEMT Reliability Testing
David Cheney ; Brent P. Gila ; Erica A. Douglas ; Fan Ren ; Stphen J. Pearton
Pub. info.: Reliability and materials issues of semiconductor optical and electrical devices and materials : symposium held November 29 - December 3, Boston, Massachusetts, U.S.A..  pp.143-150,  2010.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 1195