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Test and measurement applications of optoelectronic devices : 21-22 January 2002, San Jose, USA. pp.165-170, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Smart structures and materials 2002 : active materials : behavior and mechanics : 18-21 March 2002, San Diego, USA. pp.374-385, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Shimizu, T. ; Nagata, S. ; Edwards, C. ; Tarbell, T. ; Kashiwagi, Y. ; Kodeki, K. ; Ito, O. ; Miyagawa, H. ; Nagase, M. ; Inoue, S. ; Kaneko, K. ; Sakamoto, Y. ; Ichimoto, K. ; Tsuneta, S. ; Miki, S. ; Endo, M. ; Tabata, M. ; Nakaoji, T. ; Matsuzaki, K. ; Kobayashi, K. ; Otsubo, M. ; Suematsu, Y. ; Kumagai, K. ; Noguchi, M. ; Tamura, T. ; Nakagiri, M.
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Optical, infrared, and millimeter space telescopes : 21-25 June 2004, Glasgow, Scotland, United Kingdom. pp.1199-1206, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Microlithography 1999 : advances in resist technology and processing XVI : 15-17 March 1999, Santa Clara, California. pp.828-836, 1999. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Microlithography 1999 : advances in resist technology and processing XVI : 15-17 March 1999, Santa Clara, California. pp.368-379, 1999. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
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Optical fiber and planar waveguide technology II : APOC 2002 : Asia-Pacific Optical and Wireless Communications : 16-18 October 2002, Shanghai, China. pp.109-119, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Microlithography 1999 : advances in resist technology and processing XVI : 15-17 March 1999, Santa Clara, California. pp.732-738, 1999. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering