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Silicon carbide 2004--materials, processing and devices : symposium held April 14-15, 2004, San Francisco, California, U.S.A.. pp.229-234, 2004. Warrendale, Pa.. Materials Research Society
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Metrology, Inspection, and Process Control for Microlithography XVI. Part One pp.53-57, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering