1.

Conference Proceedings

Conference Proceedings
Omling,P. ; Emanuelsson,P. ; Grimmeiss,H.G.
Pub. info.: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part1  pp.445-450,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 38-41
2.

Conference Proceedings

Conference Proceedings
Emanuelsson,P. ; Gehlhoff, W. ; Omling, P. ; Grimmeiss, H.G.
Pub. info.: Impurities, defects, and diffusion in semiconductors : bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A..  pp.307-312,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 163
3.

Conference Proceedings

Conference Proceedings
Emanuelsson,P. ; Omling,P. ; Grimmeiss,H.G. ; Cehlhoff,W. ; Kreissl,J. ; Irmscher,K. ; Rehse,U.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.1  pp.137-142,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87
4.

Conference Proceedings

Conference Proceedings
Meyer,B.K. ; Omling,P. ; Emanuelsson,P.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.397-398,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
5.

Conference Proceedings

Conference Proceedings
Stadler,W. ; Meyer,B.K. ; Hofmann,D.M. ; Kowalski,B. ; Emanuelsson,P. ; Omling,P. ; Weigl,E. ; Miiller-Vogt,G. ; Cox,R.T.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.399-404,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
6.

Conference Proceedings

Conference Proceedings
Ghatnekar-Nilsson,S. ; Kleverman,M. ; Emanuelsson,P. ; Grimmeiss,H.G.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.171-176,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147