Emanuelsson,P. ; Gehlhoff, W. ; Omling, P. ; Grimmeiss, H.G.
Pub. info.:
Impurities, defects, and diffusion in semiconductors : bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A.. pp.307-312, 1990. Pittsburgh, Pa.. Materials Research Society
Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991. Pt.1 pp.137-142, 1992. Zurich, Switzerland. Trans Tech Publications
Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993. Pt.1 pp.397-398, 1994. Zurich, Switzerland. Trans Tech Publications
Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993. Pt.1 pp.399-404, 1994. Zurich, Switzerland. Trans Tech Publications
Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993. Pt.1 pp.171-176, 1994. Zurich, Switzerland. Trans Tech Publications
Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988. Part1 pp.445-450, 1989. Aederlmannsdorf, Switzwelns. Trans Tech Publications