Monte Carlo Simulation for Reliability Physics Modeling and Prediction of Scaled (100NM) Silicon MOSFET Devices

Monte Carlo Simulation for Reliability Physics Modeling and Prediction of Scaled (100NM) Silicon MOSFET Devices

Author(s):

Publication title:

Future trends in microelectronics : reflections on the road to nanotechnology

Title of ser.:

NATO ASI series. Series E, Applied sciences

Ser. no.:

323

Pub. Year:

1996

Page(from):

227

Page(to):

236

Pages:

10

Pub. info.:

Dordrecht: Kluwer Academic Publishers

ISSN:

0168132X

ISBN:

9780792341697 [0792341694]

Language:

English

Call no.:

N11482/323

Type:

Conference Proceedings

Details

TDL ID:	ZA00019646
Series ID:	PA00000018
Conf. info. (Name):	NATO Advanced Research Workshop on Future Trends in Microelectronics: Reflections on the Road to Nanotechnology
Conf. info. (Number):	1995
Conf. info. (Venue):	Ile de Bendor, France
Conf. info. (Date):	1995.07.17-1995.07.21

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