Statistical Analysis of Micropipe Defect Distributions in Silicon Carbide Crystals
- Author(s):
Elkington, Troy Emorhokpor, Ejiro Kerr, Tom Chen, John Essary, Kevin Golab, Mike Hopkins, Richard H. - Publication title:
- New applications for wide-bandgap semiconductors : symposium held April 22-24, 2003, San Francisco, California, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 764
- Pub. Year:
- 2003
- Page(from):
- 177
- Page(to):
- 182
- Pages:
- 6
- Pub. info.:
- Warrendale, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558997011 [1558997016]
- Language:
- English
- Call no.:
- M23500/764
- Type:
- Conference Proceedings
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