1.

Conference Proceedings
Conference Proceedings
1. Optical constant measurements of the uppermost layer of a reflection multilayer using reflection and total electron yield spectra [6317-35]
Ejima, T. ; Harada, T. ; Yamazaki, A.
Pub. info.: Advances in X-ray/EUV optics, components, and applications : 14-16 August 2006, San Diego, California, USA.  pp.63170Z-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6317
2.

Conference Proceedings
Conference Proceedings
2. VISCOSITIES OF ALKALI CARBONATE MELTS FOR MCFC
Sato, Y. ; Yamamura, T. ; Zhu, H. ; Endo, M. ; Yamazaki, T. ; Kato, H. ; Ejima, T. ; Janz, G.J.
Pub. info.: Proceedings of the Third International Symposium on Carbonate Fuel Cell Technology.  pp.416-428,  1993.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1993-3
3.

Conference Proceedings
Conference Proceedings
3. Angle-dependent total electron yield spectra in multilayer films for standing wave measurements
Ejima, T. ; Muramatsu, Y. ; Takenaka, H.
Pub. info.: Optical constants of materilas for UV to x-ray wavelengths : 4-5 August 2004, Denver, Colorado, USA.  pp.138-143,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5538
4.

Conference Proceedings
Conference Proceedings
4. HeadFinder: a real-time robust head detection and tracking system
Baba, N. ; Matsuo, H. ; Ejima, T.
Pub. info.: Real-Time Imaging VI.  pp.42-51,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4666
5.

Conference Proceedings
Conference Proceedings
5. Tunnel crack detection and classification system based on image processing
Liu, Z. ; Suandi, S. A. ; Ohashi, T. ; Ejima, T.
Pub. info.: Machine Vision Applications in Industrial Inspection X.  pp.145-152,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4664