1.

Conference Proceedings

Conference Proceedings
Jacobs, E.L. ; Edwards, T.C. ; Miller, B. ; Hodgkin, V.A.
Pub. info.: Infrared and passive millimeter-wave imaging systems : design, analysis, modeling, and testing : 3-5 April 2002, Orland, USA.  pp.34-41,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4719
2.

Conference Proceedings

Conference Proceedings
Edwards, T.C. ; Vollmerhausen, R.H. ; Cohen, J. ; Harris, T.
Pub. info.: Infrared and passive millimeter-wave imaging systems : design, analysis, modeling, and testing : 3-5 April 2002, Orland, USA.  pp.42-50,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4719
3.

Conference Proceedings

Conference Proceedings
Hodgkin, V.A. ; Jacobs, E.L. ; Edwards, T.C.
Pub. info.: Infrared imaging systems: design, analysis, modeling, and testing XIV : 23-24 April 2003, Oriando, Florida, USA.  pp.41-52,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5076
4.

Conference Proceedings

Conference Proceedings
Edwards, T.C. ; Vollmerhausen, R.H. ; Driggers, R.G. ; Grove, E.
Pub. info.: Infrared imaging systems: design, analysis, modeling, and testing XIV : 23-24 April 2003, Oriando, Florida, USA.  pp.53-59,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5076
5.

Conference Proceedings

Conference Proceedings
Moyer, S.K. ; Flug, E. ; Edwards, T.C. ; Krapels, K.A. ; Scarbrough, J.
Pub. info.: Infrared imaging systems: design, analysis, modeling, and testing XV : 14-15 April 2004, Oriando, Florida, USA.  pp.116-126,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5407