1.

Conference Proceedings
Conference Proceedings
1. Auger depth profiling of thin SiC layers:practical aspects for a better understanding of quantitative analysis
Pieterwas,R. ; Kosiba,R. ; Ecke,G. ; Pezoldt,J. ; RoBler,H.
Pub. info.: Third International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering : 7-11 June 1999, St. Petersburg, Russia.  pp.281-287,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4064
2.

Conference Proceedings
Conference Proceedings
2. The Measurement of the Thickness of Thin SiC Layers on Silicon
Cimalla,V. ; Scheiner,J. ; Ecke,G. ; Friedrich,M. ; Goldhahn,R. ; Zahn,D.R.T. ; Pezoldt,J.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part1  pp.641-644,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
3.

Conference Proceedings
Conference Proceedings
3. Growth of SiC Layers on(111)Si by Solid Source Molecular Beam Epitaxy
Pezoldt,J. ; Stauden,T. ; Cimalla,V. ; Ecke,G. ; Romanus,H. ; Eichhorn,G.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part1  pp.251-254,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268