1.

Conference Proceedings

Conference Proceedings
Walraven,J.A. ; Cole Jr.,E.I. ; Sloan,L.R. ; Hietala,S.L. ; Tigges,C.P. ; Dyck,C.W.
Pub. info.: Reliability, testing, and characterization of MEMS/MOEMS : 22-24 October 2001, San Trancisco, USA.  pp.254-259,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4558
2.

Conference Proceedings

Conference Proceedings
Dyck,C.W. ; Smith,J.H. ; Miller,S.L. ; Russick,E.M. ; Adkins,C.L.
Pub. info.: Micromachining and microfabrication process technology II : 14-15 October, 1996, Austin, Texas.  pp.225-235,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2879
3.

Conference Proceedings

Conference Proceedings
Dyck,C.W. ; Allen,J.J. ; Huber,R.J.
Pub. info.: Micromachined Devices and Components V.  pp.198-209,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3876
4.

Conference Proceedings

Conference Proceedings
Staple,B.D. ; Watts,H.A. ; Dyck,C.W. ; Griego,A.P. ; Hewlett,F.W. ; Smith,J.H.
Pub. info.: Materials and Device Characterization in Micromachining.  pp.410-420,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3512