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Conference Proceedings

1. Silicon epitaxy and oxidation

Meindl D. J. ; Dutton W. R. ; Saraswat C. K. ; Plummer D. J. ; Kamins I. T. ; Deal E. B.

Pub. info.:	Process and device modeling for integrated circuit design : [proceedings of the NATO Advanced Study Institute on Process and device modeling for integrated circuit design, Louvain-la-Neuve, Belgium, July 19-29, 1977]. pp.57-113, 1977. Leyden. Noordhoff International Publishing
Title of ser.:	NATO ASI series. Series E, Applied sciences
Ser. no.:	21

Conference Proceedings

2. Bipolar models for statistical IC design

Dutton W. R. ; Divekar A. D.

Pub. info.:	Process and device modeling for integrated circuit design : [proceedings of the NATO Advanced Study Institute on Process and device modeling for integrated circuit design, Louvain-la-Neuve, Belgium, July 19-29, 1977]. pp.461-517, 1977. Leyden. Noordhoff International Publishing
Title of ser.:	NATO ASI series. Series E, Applied sciences
Ser. no.:	21