1.

Conference Proceedings
Conference Proceedings
1. Micro-Raman Analysis of Hydrogen Related Defects in Czochralski Silicon (Invited)
Job, R. ; Dungen, W. ; Ma, Y. ; Huang, Y. L.
Pub. info.: Microelectronics technology and devices : SBMICRO 2005 : proceedings of the twentieth international symposium.  pp.90-105,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-08
2.

Conference Proceedings
Conference Proceedings
2. μ-Raman Spectra Analysis of the Evolution of Hydrogen Related Defects and Void Formation in the Silicon Ion-Cut Process
Dungen, W. ; Job, R. ; Ma, Y. ; Huang, Y.L. ; Fahrner, W.R. ; Keller, L.O. ; Horstmann, J.T.
Pub. info.: Semiconductor defect engineering - materials, synthetic structures and devices : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A..  pp.503-508,  2005.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 864
3.

Conference Proceedings
Conference Proceedings
3. Void Formation in Hydrogen Implanted and Subsequently Plasma Hydrogenated and Annealed Czochralski Silicon
Job, R. ; Dungen, W. ; Ma, Y. ; Huang, Y.L. ; Horstmann, J.T.
Pub. info.: Semiconductor defect engineering - materials, synthetic structures and devices : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A..  pp.487-492,  2005.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 864
4.

Conference Proceedings
Conference Proceedings
4. On the Formation Kinetics of Thin Nanopatterned Layers on Silicon Wafers Created by Hydrogen Plasma Exposure
Job, R. ; Huang, Y. L. ; Ma, Y. ; Zolgert, B. ; Dungen, W.
Pub. info.: Kinetics-driven nanopatterning on surfaces : symposium held November 29-December 2, 2004, Boston, Massachusetts, U.S.A..  pp.103-108,  2005.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 849
5.

Conference Proceedings
Conference Proceedings
5. Control of Stress in Surface Engineered Silicon
Ma, Y. ; Job, R. ; Zolgert, B. ; Dungen, W. ; Huang, Y. L. ; Fahrner, W. R.
Pub. info.: Surface engineering 2004 - fundamentals and applications : symposium held November 30-December 2, 2004, Boston, Massachusetts, U.S.A..  pp.99-104,  2005.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 843
6.

Conference Proceedings
Conference Proceedings
6. P-N Junction Diodes Fabricated Based on Donor Formation in Plasma Hydrogenated P-Type Czochralski Silicon
Huang, Y.L. ; Simoen, E. ; Job, R. ; Claeys, C. ; Dungen, W. ; Ma, Y. ; Fahrner, W.R. ; Versluys, J. ; Clauws, P.
Pub. info.: Semiconductor defect engineering - materials, synthetic structures and devices : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A..  pp.307-312,  2005.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 864