1.

Conference Proceedings

Conference Proceedings
Druffner, C.J. ; Sathish, S.
Pub. info.: Nondestructive Evaluation and Reliability of Micro- and Nanomaterial Systems.  pp.105-113,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4703
2.

Conference Proceedings

Conference Proceedings
Meyendorf, N. ; Sathish, S. ; Druffner, C.J. ; Blackshire, J.L. ; Hoffmann, J.P. ; Zhan, Q. ; Andrews, R.J.
Pub. info.: Testing, Reliability, and Application of Micro-and Nano-Material Systems II.  pp.256-265,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5392
3.

Conference Proceedings

Conference Proceedings
Druffner, C.J. ; Kee, P.D. ; Lange, M.A. ; Perram, G.P. ; Biggers, R.R. ; Barnes, P.N.
Pub. info.: High-Power Laser Ablation V.  pp.153-164,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5448
4.

Conference Proceedings

Conference Proceedings
Druffner, C.J. ; Schumaker, E.J. ; Murray, P.T. ; Sathish, S.
Pub. info.: Testing, Reliability, and Application of Micro-and Nano-Material Systems.  pp.122-131,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5045