1.

Conference Proceedings
Conference Proceedings
1. Comparison of partially and fully depleted SOI transistors down to the sub 50-nm-gate length regime
Dreeskornfeld, L. ; Hartwich, J. ; Landgraf, E. ; Luyken, R.J. ; Roesner, W. ; Schulz, T. ; Staedele, M. ; Schmitt-Landsiedel, D. ; Risch, L.
Pub. info.: Silicon-on-insulator technology and devices XI : proceedings of the international symposium.  pp.361-366,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-5
2.

Conference Proceedings
Conference Proceedings
2. Perspectives for Ultra High Density Nonvolatile Data Storage (Invited paper)
Specht, M. ; Dorna, U. ; Hofinann, F. ; Dreeskornfeld, L. ; Kretz, J. ; Stadele, M. ; Wilier, J. ; Rosner, W. ; Risch, L.
Pub. info.: ULSI Process Integration : proceedings of the International Symposium.  pp.296-305,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-06