1.

Conference Proceedings
Conference Proceedings
1. Electron Microscopic Studies of Co- and Ti-Germanosilicide Films Formed on SiGe Layers
Jin, S. ; Donaton, R. A. ; Bender, H. ; Maex, K.
Pub. info.: Electron microscopy of semiconducting materials and ULSI devices : symposium held Aprl 15-16, 1998, San Francisco, California, U. S. A..  pp.133-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 523
2.

Conference Proceedings
Conference Proceedings
2. Microstructural Studies of Co Silicide Layers Formed on SiGe and SiGeC
Jin, S. ; Bender, H. ; Donaton, R. A. ; Maex, K. ; Vantomme, A. ; Langouche, G. ; Amour, A. St. ; Sturm, J. C.
Pub. info.: Structure and evolution of surfaces : symposium held December 2-5, 1996, Boston, Massachusette, U.S.A..  pp.481-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 440
3.

Conference Proceedings
Conference Proceedings
3. Characterization of Ultra-Thin PtSi Films for Infrared Detectors
Bender, H. ; Roussel, P. ; Kolodinski, S. ; Torres, A. ; Donaton, R. A. ; Maex, K. ; Sluis, P. Van der
Pub. info.: Silicide thin films - fabrication, properties, and applications : Symposium held November 27-30, 1995, Boston, Massachusetts, USA.  pp.449-,  1996.  Pittsburgh.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 402
4.

Conference Proceedings
Conference Proceedings
4. The Influence of Ti Capping Layers on CoSi2 Formation in the Presence of Interfacial Oxide
Detavernier, C. ; Donaton, R. A. ; Maex, K. ; Jin, S. ; Bender, H. ; Meirhaeghe, R. Van ; Cardon, F.
Pub. info.: Advanced interconnects and contacts : symposium held April 5-7, 1999, San Francisco, California, U.S.A..  pp.139-,  1999.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 564
5.

Conference Proceedings
Conference Proceedings
5. New Approaches for Formation of Ultra-Thin PtSi Layers for Infrared Applications
Donaton, R. A. ; Jin, S. ; Bender, H. ; Zagrebnov, M. ; Baert, K. ; Maex, K. ; Vantomme, A. ; Langouche, G.
Pub. info.: Rapid thermal and integrated processing VII : symposium held April 13-15, 1998, San Francisco, California, U.S.A..  pp.307-,  1998.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 525
6.

Conference Proceedings
Conference Proceedings
6. A BEEM Study of PtSi Schottky Contacts on Ion-Milled Si
Ru, G-P. ; Detavernier, C. ; Donaton, R. A. ; Blondeel, A. ; Clauws, P. ; Meirhaeghe, R. L. Van ; Cardon, F. ; Maex, K. ; Qu, X-P. ; Zhu, S-Y. ; Li, B-Z.
Pub. info.: Advanced interconnects and contacts : symposium held April 5-7, 1999, San Francisco, California, U.S.A..  pp.201-,  1999.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 564
7.

Conference Proceedings
Conference Proceedings
7. Influence of SiGe Thickness on the Co/SiGe/Si Solid State Reaction
Donaton, R. A. ; Jin, S. ; Bender, H. ; Maex, K. ; Vantomme, A. ; Langouche, G.
Pub. info.: Advanced interconnects and contacts : symposium held April 5-7, 1999, San Francisco, California, U.S.A..  pp.151-,  1999.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 564
8.

Conference Proceedings
Conference Proceedings
8. Titanium Silicidation and Secondary Defect Annihilation in Ion Beam Processed SiGe Layers
Larsen, K. Kyllesbech ; Via, F. La ; Lombardo, S. ; Raineri, V. ; Donaton, R. A. ; Campisano, S. U.
Pub. info.: Silicide thin films - fabrication, properties, and applications : Symposium held November 27-30, 1995, Boston, Massachusetts, USA.  pp.149-,  1996.  Pittsburgh.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 402
9.

Conference Proceedings
Conference Proceedings
9. Structural and Electrical Characterization of FeSix-Layers (1｡蛉｡？) Prepared by RTP of Fe Layers Sputtered on Si (100)
Libezny, M. ; Poortmans, J. ; Amesz, P. H. ; Donaton, R. A. ; Larsen, K. Kyllesbech ; Vandenabeele, P. ; Jonckx, F. ; Maex, K. ; Nijs, J.
Pub. info.: Rapid thermal and integrated processing IV : symposium held April 17-20, 1995, San Francisco, California, U.S.A..  pp.389-,  1995.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 387