1.

Conference Proceedings
Conference Proceedings
1. X-RAY DIFFRACTION DETERMINATION OF STRESSES IN THIN FILMS
Vreeland, Jr. T. ; Dommann, A. ; Tsai, C.-J. ; Nicolet, M.-A.
Pub. info.: Thin films : stresses and mechanical properties : symposium held November 28-30, 1988, Boston, Massachusetts, U.S.A..  pp.3-12,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 130
2.

Conference Proceedings
Conference Proceedings
2. Structural and electrical characterization of Si-MODFET structures grown at high rates by LEPECVD
Rosenblad, C. ; Kummer, M. ; Muller, E. ; Dommann, A. ; Kanel, H. Von
Pub. info.: Substrate engineering - paving the way to epitaxy : sympoisum held November 29-December 3, 1999, Boston, Massachusetts, U.S.A..  pp.O7.9.1-,  2000.  Warrendale, Pa..  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 587
3.

Conference Proceedings
Conference Proceedings
3. Properties of Zn Implanted GaN
Strite, S. ; Epperlein, P. W. ; Dommann, A. ; Rockett, A. ; Broom, R. F.
Pub. info.: Gallium nitride and related materials : the First International Symposium on Gallium Nitride and Related Materials held November 27-December 1, 1995, Boston, Massachusetts, U.S.A..  pp.795-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 395
4.

Conference Proceedings
Conference Proceedings
4. Dual-axis single-mirror mechanism for beam steering and stabilisation in optical inter satellite links
Coppoolse, W. ; Kreienbuehl, M. ; Moersehell, J. ; Dommann, A. ; Bertsch, D.
Pub. info.: 10th European Space Mechanisms and Tribology Symposium, 24-26 September 2003, San Sebastián, Spain.  pp.183-190,  2003.  Noordwijk, The Netherlands.  ESA Publications Division
Title of ser.: ESA SP
Ser. no.: 524
5.

Conference Proceedings
Conference Proceedings
5. Reciprocating silicon microtribometer
Dubois, P. ; Gunten, S. ; Enzler, A. ; Lippuner, U. ; Dommann, A. ; Rooij, N.-F.
Pub. info.: Reliability, Testing, and Characterization of MEMS/MOEMS II.  pp.163-174,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4980