1.

Conference Proceedings
Conference Proceedings
1. Microscopic Structural Quality of Large-Area Highly-Oriented Diamond on Silicon Substrates for Active Electronic Applications
Steinbach, D. ; Floeter, A. ; Guettler, H. ; Zachai, R. ; Bergmaier, A. ; Dollinger, G.
Pub. info.: Proceedings of the Fifth International Symposium on Diamond Materials.  pp.521-536,  1997.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-32
2.

Conference Proceedings
Conference Proceedings
2. Elemental Analysis on Group-III Nitrides Using Heavy Ion ERD
Dollinger, G. ; Karsch, S. ; Ambacher, O. ; Angerer, H. ; Bergmaier, A. ; Schmelmer, O. ; Stutzmann, M.
Pub. info.: Nitride semiconductors : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A..  pp.745-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 482
3.

Conference Proceedings
Conference Proceedings
3. Characterization of AlxGa1-xN Films Prepared by Plasma-Induced Molecular-Beam Epitaxy on c-Plane Sapphire
Angerer, H. ; Ambacher, O. ; Stutzmann, M. ; Metzger, T. ; Hopler, R. ; Born, E. ; Bergmaier, A. ; Dollinger, G.
Pub. info.: Gallium nitride and related materials II : symposium held April 1-4, 1997, San Francisco, California, U.S.A..  pp.305-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 468
4.

Conference Proceedings
Conference Proceedings
4. Recent Developments in Nuclear Methods in Support of Semiconductor Characterization
Brijs, B. ; Bender, H. ; Huyghebaert, C. ; Janssens, T. ; Vandervorst, W. ; Nakajima, K. ; Kimura, K. ; Bergmaier, A. ; Dollinger, G. ; van den Berg, J.A.
Pub. info.: Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah.  pp.50-62,  2003.  Pennington, NJ.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5133
5.

Conference Proceedings
Conference Proceedings
5. Physical Characterization of Thin HfO2 Layers by the Combined Analysis with Complementary Techniques
Bender, H. ; Conard, T. ; Richard, O. ; Brijs, B. ; Petry, J. ; Vandervorst, W. ; Defranoux, C. ; Boher, P. ; Rochat, N. ; Wyon, C. ; Mack, P. ; Wolstenholme, J. ; Vitchev, R. ; Houssiau, L. ; Pireaux, J-J. ; Bergmaier, A. ; Dollinger, G.
Pub. info.: Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah.  pp.223-232,  2003.  Pennington, NJ.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5133
6.

Conference Proceedings
Conference Proceedings
6. Nitrogen Profile and Electrical Properties of Reoxidized Thermally Grown Silicon Nitride
Ludsteck, A, ; Schulze, J. ; Eisele, I. ; Dietl, W. ; Chung, H. ; Nenyei, Z. ; Bergmaier, A. ; Dollinger, G.
Pub. info.: Silicon nitride, silicon dioxide thin insulating films, and other emerging dieletrics VIII : proceedings of the international symposium.  pp.232-241,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-01
7.

Conference Proceedings
Conference Proceedings
7. Physical Characterization of Thin HfO2 Layers by the Combined Analysis with Complementary Techniques
Bender, H. ; Brijs, B. ; Peby, J. ; Vandervorst, W. ; Defranoux, C. ; Boher, P. ; Rochat, N. ; Wyon, C. ; Mack, P. ; Woistenholme, I. ; Vitchev, R. ; Houssiau, L. ; Pireaux, J.-J. ; Bergmaier, A. ; Dollinger, G. ; Conard, T. ; Richard, O.
Pub. info.: Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah.  pp.223-232,  2003.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-3
8.

Conference Proceedings
Conference Proceedings
8. Recent Developments in Nuclear Methods in Support of Semiconductor Characterization
Brijs, B. ; Bender, H. ; Huyghebaert, C. ; Janssens, T. ; Vandervorsi, W. ; Nakajima, K. ; Kimura, K. ; Bergmaier, A. ; Dollinger, G. ; van den Berg, J.A.
Pub. info.: Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah.  pp.50-62,  2003.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-3
9.

Conference Proceedings
Conference Proceedings
9. Basic aspects of deep lithography with particles for the fabrication of micro-optical and micromechanical structures
Volckaerts, B. ; Vynck, P. ; Vervaeke, M. ; Cosentino, L. ; Finocchiaro, P. ; Reichart, P. ; Datzmann, G. ; Hauptner, A. ; Dollinger, G. ; Hermanne, A. ; Thienpont, H.
Pub. info.: Micro-Optics: Fabrication, Packaging, and Integration.  pp.52-63,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5454