1.
|
Conference Proceedings
|
Dobson J. P. ; Joyce A. B. ; Neave H. J. ; Zhang J.
Pub. info.: |
Surface and interface characterization by electron optical methods. pp.185-193, 1988. New York. Plenum Press |
Title of ser.: |
NATO ASI series. Series B, Physics |
Ser. no.: |
191 |
|
2.
|
Conference Proceedings
|
Dobson J. P.
Pub. info.: |
Surface and interface characterization by electron optical methods. pp.159-184, 1988. New York. Plenum Press |
Title of ser.: |
NATO ASI series. Series B, Physics |
Ser. no.: |
191 |
|
3.
|
Conference Proceedings
|
Joyce A. B. ; Neave H. J. ; Zhang J. ; Dobson J. P.
Pub. info.: |
Reflection high-energy electron diffraction and reflection electron imaging of surfaces. pp.397-417, 1988. New York. Plenum Press |
Title of ser.: |
NATO ASI series. Series B, Physics |
Ser. no.: |
188 |
|
4.
|
Conference Proceedings
|
Dobson J. P.
Pub. info.: |
Evaluation of advanced semiconductor materials by electron microscopy. pp.267-282, 1989. New York. Plenum Press |
Title of ser.: |
NATO ASI series. Series B, Physics |
Ser. no.: |
203 |
|
5.
|
Conference Proceedings
|
Joyce A. B. ; Neave H. J. ; Zhang J. ; Dobson J. P. ; Dawson P. ; Moore J. K. ; Foxon T. C.
Pub. info.: |
Thin film growth techniques for low-dimensional structures. pp.19-35, 1987. New York. Plenum Press |
Title of ser.: |
NATO ASI series. Series B, Physics |
Ser. no.: |
163 |
|