1.

Conference Proceedings

Conference Proceedings
Hayes, G.R. ; Haacke, S. ; Kauer, M. ; Stanley, R.P. ; Houdre, R. ; Oesterle, U. ; Deveaud, B.
Pub. info.: Proceedings of the International Conference on Excitonic Processes in Condensed Matter : EXCON '98.  pp.28-34,  1998.  Pennington, N. J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 98-25
2.

Conference Proceedings

Conference Proceedings
Bremond, G. ; Nouailhat, A. ; Guillot, G. ; Deveaud, B. ; Lambert, B. ; Toudic, Y. ; Clerjaud, B. ; Naud, C.
Pub. info.: Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A..  pp.359-364,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 46
3.

Conference Proceedings

Conference Proceedings
Portella-Oberli, M.T. ; Ciulin, V. ; Ganiere, J.-D. ; Deveaud, B. ; Kossacki, P. ; Kutrowski, M. ; Wojtowicz, T.
Pub. info.: Optical properties of 2D systems with interacting electrons.  pp.205-216,  2003.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 119
4.

Conference Proceedings

Conference Proceedings
Aichmayr, G. ; Martin, M.D. ; Vina, L. ; Andre, R. ; Ciulin, V. ; Ganiere, J.D. ; Deveaud, B.
Pub. info.: Optical properties of 2D systems with interacting electrons.  pp.63-78,  2003.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 119