1.

Conference Proceedings
Conference Proceedings
1. Development of CVD Diamond Radiation Detectors
Adam, W. ; Bauer, C. ; Berdermann, E. ; Bogani, F. ; Borchi, E. ; Bruzzi, M. ; Colledani, C. ; Conway, J. ; Dabrowski, W. ; Delpierre, P. ; Deneuville, A. ; Dulinski, W. ; Eijk, B.van. ; Fallou, A. ; Fish, D. ; Foulon, F. ; Friedl, M. ; Gan, K.K. ; Gheeraert, E. ; Grigoriev, E. ; Hallewell, G. ; Hall-Wilton, R. ; Han, S. ; Hartjes, F. ; Hrubee, J. ; Husson, D. ; Kagan, H. ; Kania, D. ; Kaplon, J. ; Kass, R. ; Knoepfle, K.T. ; Krammer, M. ; Manfredi, P.F. ; Meier, D. ; Mishina, M. ; LeNormand, F. ; Pan, L.S. ; Pernegger, H. ; Pernicka, M. ; Pirollo, S. ; Re, V. ; Riester, J.L. ; Roe, S. ; Roff, D. ; Rudge, A. ; Schnetzer, S. ; Sciortino, S. ; Speziali, V. ; Stelzer, H. ; Stone, R. ; Tapper, R.J. ; Tesarek, R. ; Thomson, G.B. ; Trawick, M. ; Trischuk, W. ; Turchetta, R. ; Walsh, A.M. ; Wedenig, R. ; Weilhammer, P. ; Ziock, H. ; Zoeller, M.M.
Pub. info.: Proceedings of the Fifth International Symposium on Diamond Materials.  pp.491-502,  1997.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-32
2.

Conference Proceedings
Conference Proceedings
2. RAMAN STUDIES OF ZnSe LATTICE DAMAGE AND RECOVERY DUE TO N IMPLANTATION AND ANNEALING
Deneuville, A. ; Ayyub, P. ; Park, C.H. ; Anderson, T. ; Lowen, P. ; Jones, K.S. ; Holloway P.H.
Pub. info.: Defects in materials : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A..  pp.457-462,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 209
3.

Conference Proceedings
Conference Proceedings
3. Development of imaging arrays for solar UV observations based on wide band gap materials
Schuehle, U.H. ; Hochedez, J.-F.E. ; Pau, J.L. ; Rivera, C. ; Munoz, E. ; Alvarez, J. ; Kleider, J.-P. ; Lemaire, P. ; Appourchaux, T. ; Fleck, B. ; Peacock, A. ; Richter, M. ; Kroth, U. ; Gottwald, A. ; Castex, M.-C. ; Deneuville, A. ; Muret, P. ; Nesladek, M. ; Omnes, F. ; John, J. ; Hoof, C. V.
Pub. info.: Telescopes and instrumentation for solar astrophysics : 7-8 August 2003, San Diego, California, USA.  pp.231-238,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5171
4.

Conference Proceedings
Conference Proceedings
4. Hydrogen Diffusion in Boron-Doped Diamond: Evidence of Hydrogen-Boron Interactions
Chevallier, J. ; Theys, B. ; Grattepain, C. ; Deneuville, A. ; Gheeraert, E.
Pub. info.: Defect and impurity engineered semiconductors, II : symposium held April 13-17, 1998, San Francisco, California, U.S.A..  pp.169-,  1998.  Warrendale, Pa.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 510
5.

Conference Proceedings
Conference Proceedings
5. 3C-SiC Pseudosubstrates for the Growth of Cubic GaN
Aboughe-Nze, P. ; Chassagne, T. ; Chaussende, D. ; Monteil, Y. ; Cauwet, F. ; Bustarret, E. ; Deneuville, A. ; Bentoumi, G. ; Martinez-Guerrerro, E. ; Daudin, B. ; Feuillet, G.
Pub. info.: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.1467-1470,  2000.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 338-342(2)
6.

Conference Proceedings
Conference Proceedings
6. New UV detectors for solar observations
Hochedez, J.-F. ; Schuehle, U.H. ; Pau, J.L. ; Alvarez, J. ; Hainaut, O. ; Appourchaux, T.P. ; Auret, D.F. ; Belsky, A. ; Bergonzo, P. ; Castex, M.-C. ; Deneuville, A. ; Dhez, P. ; Fleck, B. ; Haenen, K. ; Idir, M. ; Kleider, J.-P. ; Lefeuvre, E. ; Lemaire, P. ; Monroy, E. ; Muret, P. ; Munoz, E. ; Nesladek, M. ; Omnes, F. ; Pace, E. ; Peacock, A.J. ; Van Hoof, C.A.
Pub. info.: Innovative telescopes and instrumentation for solar astrophysics : 24-28 August 2002, Waikoloa, Hawaii, USA.  pp.419-426,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4853