Study of grain boundaries in YBCO thin films using microraman spectroscopy
- Author(s):
Martinez, O. ( Fisica de la Materia Condensada, ETS Ingenieros Industriales ) Jimenez, J. ( Fisica de la Materia Condensada, ETS Ingenieros Industriales ) Martin, P. ( Fisica de la Materia Condensada, ETS Ingenieros Industriales ) Chambonnet, D. ( Alcatel Alsthom ) Degoy, S. ( Alcatel Alsthom ) Belouet, C. ( Alcatel Alsthom ) - Publication title:
- Epitaxial oxide thin films II : symposium held November 26-30, 1995, Boston, Massachusetts, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 401
- Pub. Year:
- 1996
- Page(from):
- 405
- Page(to):
- 410
- Pub. info.:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558993044 [1558993045]
- Language:
- English
- Call no.:
- M23500/401
- Type:
- Conference Proceedings
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