1.

Conference Proceedings
Conference Proceedings
1. Diode laser bars deliver > 400-W peak CW power from 800-nm to 980-nm enabling wide range of applications [6397-06]
Crump, P. ; Patterson, S. ; Wang, J. ; Dong, W. ; Grimshaw, M. ; Zhang, S. ; Elim, S. ; Bougher, M. ; Patterson, J. ; Das, S. ; Wise, D. ; DeFranza, M. ; Bell, J. ; Farmer, J. ; DeVito, M.
Pub. info.: Technologies for optical countermeasures III : 12-13 September 2006, Stockholm, Sweden.  pp.639706-639706,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6397
2.

Conference Proceedings
Conference Proceedings
2. > 360 W and > 70% efficient GaAs-based diode lasers
Crump, P. ; Wang, J. ; Crum, T. ; Das, S. ; DeVito, M. ; Dong, W. ; Farmer, J. ; Feng, Y. ; Grimshaw, M. ; Wise, D. ; Zhang, S.
Pub. info.: High-power diode laser technology and applications III : 24-25 January, 2005, San Jose, California, USA.  pp.21-29,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5711
3.

Technical Paper
Technical Paper
3. Advanced flexible pointing testbed and control system design
Yu, T-J. ; Lin, C-F. ; Coleman, N. ; Paz, A. ; DeVito, M. ; Papanagopoulos, G.
Pub. info.: AIAA paper.  pp.1-11,  1996.  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA Guidance Navigation and Control Conference
Ser. no.: 1996
4.

Conference Proceedings
Conference Proceedings
4. High-efficiency high-power 808-nm laser array and stacked arrays optimized for elevated temperature operation
Crump, P.A. ; Crum, T.R. ; DeVito, M. ; Farmer, J. ; Grimshaw, M. ; Huang, Z. ; Igl, S.A. ; Macomber, S. ; Thiagarajan, P. ; Wise, D.
Pub. info.: High-Power Diode Laser Technology and Applications II.  pp.144-155,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5336