1.

Conference Proceedings
Conference Proceedings
1. Ultrafast time-resolved and spectrally resolved measurements of third-order nonlinearities in As2Se3 chalcogenide glass [5971A-13]
Tomalik, A. ; DeCorby, R.G. ; Slepkov, A.D. ; Hegmann, F.A. ; Major, A. ; Smith, P.W.E. ; Aitchison, J.S.
Pub. info.: Photonic applications in nonlinear optics, nanophotonics, and microwave photonics : 12-14 September 2005, Toronto, Canada.  pp.59710D-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5971
2.

Conference Proceedings
Conference Proceedings
2. Grating-assisted optical add-drop filter modeling and fabrication
Bryce, R.M. ; DeCorby, R.G. ; Haugen, C.J. ; Tsui, Y.Y. ; McMullin, J.N.
Pub. info.: Applications of photonic technology 5 : closing the gap between theory, development, and application : Photonics North 2002.  pp.995-1001,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4833
3.

Conference Proceedings
Conference Proceedings
3. Fabrication of aperiodic gratings on silicon-on-insulator (SOI) rib waveguides using e-beam lithography
Subramanian, V.R. ; DeCorby, R.G. ; McMullin, J.N. ; Haugen, C.J. ; Belov, M.
Pub. info.: Silicon-based and Hybrid Optoelectronics IV.  pp.45-53,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4654
4.

Conference Proceedings
Conference Proceedings
4. Integrated diffraction grating for lab-on-a-chip microspectrometers
Chen, X. ; McMullin, J.N. ; Haugen, C.J. ; DeCorby, R.G.
Pub. info.: Imaging, Manipulation, and Analysis of Biomolecules and Cells: Fundamentals and Applications III.  pp.511-516,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5699