1.

Conference Proceedings
Conference Proceedings
1. Impact of quantum-mechanical effects on the double-gate MOSFET characteristics
Dauge, F. ; Jomaah, J. ; Ghibaudo, G.
Pub. info.: Silicon-on-insulator technology and devices XI : proceedings of the international symposium.  pp.383-388,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-5
2.

Conference Proceedings
Conference Proceedings
2. Substrate bias effects in SOI FinFETs
Pretet, J. ; Dauge, F. ; Vandooren, A. ; Mathew, L. ; Nguyen, B.-Y. ; Jomash, J. ; Cristoloveanu, S.
Pub. info.: Silicon-on-insulator technology and devices XI : proceedings of the international symposium.  pp.231-236,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-5