1.

Conference Proceedings
Conference Proceedings
1. Noise modeling and performance in 0.1 5-μm fully depleted SOI MOSFET
Pailloncy, G. ; Ihiguez, B. ; Dambrine, G. ; Dehan, M. ; Raskin, J.-P. ; Matsuhashi, H. ; Delatte, P. ; Danneville, F.
Pub. info.: Noise in devices and circuits II : 26-28 May 2004, Maspalomas, Gran Canaria, Spain.  pp.122-130,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5470
2.

Conference Proceedings
Conference Proceedings
2. Thermal de-embedding procedure for cryogenic on-wafer high-frequency noise measurement
Delcourt, S. ; Dambrine, G. ; Bourzgui, N. E. ; Danneville, F. ; Laporte, C. ; Fraysse, J.-P. ; Maignan, M.
Pub. info.: Noise in devices and circuits II : 26-28 May 2004, Maspalomas, Gran Canaria, Spain.  pp.414-421,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5470
3.

Conference Proceedings
Conference Proceedings
3. High frequency noise of SOI MOSFETs: performances and limitations (Invited Paper)
Danneville, F. ; Pailloncy, G. ; Siligaris, A. ; Iniguez, B. ; Dambrine, G.
Pub. info.: Noise in devices and circuits III : 24-26 May, 2005, Austin, Texas, USA.  pp.185-199,  2005.  Bellingham, Washington.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5844
4.

Conference Proceedings
Conference Proceedings
4. High Frequency Noise Sources Extraction in Nanometique MOSFETs
Danneville, F. ; Pailloncy, G. ; Dambrine, G.
Pub. info.: Advanced experimental methods for noise research in nanoscale electronic devices.  pp.169-176,  2004.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 151
5.

Conference Proceedings
Conference Proceedings
5. Impact of down scaling on high-frequency noise performance of bulk and SOI MOSFETs (Invited Paper)
Dambrine, G. ; Raynaud, C. ; Vanmackelberg, M. ; Danneville, F. ; Pailloncy, G. ; Lepilliet, S. ; Raskin, J.P.
Pub. info.: Noise in Devices and Circuits.  pp.105-119,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5113
6.

Conference Proceedings
Conference Proceedings
6. High-frequency noise in FDSOI MOSFETs: a Monte Carlo investigation
Rengel, R. ; Mateos, J. ; Pardo, D. ; Gonzalez, T. ; Martin, M.J. ; Dambrine, G. ; Danneville, F. ; Raskin, J.-P.
Pub. info.: Noise in Devices and Circuits.  pp.379-386,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5113