Pailloncy, G. ; Ihiguez, B. ; Dambrine, G. ; Dehan, M. ; Raskin, J.-P. ; Matsuhashi, H. ; Delatte, P. ; Danneville, F.
Pub. info.:
Noise in devices and circuits II : 26-28 May 2004, Maspalomas, Gran Canaria, Spain. pp.122-130, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Delcourt, S. ; Dambrine, G. ; Bourzgui, N. E. ; Danneville, F. ; Laporte, C. ; Fraysse, J.-P. ; Maignan, M.
Pub. info.:
Noise in devices and circuits II : 26-28 May 2004, Maspalomas, Gran Canaria, Spain. pp.414-421, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Danneville, F. ; Pailloncy, G. ; Siligaris, A. ; Iniguez, B. ; Dambrine, G.
Pub. info.:
Noise in devices and circuits III : 24-26 May, 2005, Austin, Texas, USA. pp.185-199, 2005. Bellingham, Washington. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering