1.

Conference Proceedings
Conference Proceedings
1. The Chemical Identification of Defect Impurities Using Radioactive Isotopes
Daly,S.E. ; Henry,M.O. ; Frehill,C.A. ; Freitag,K. ; Vianden,R. ; Rohrlack,G. ; Forkel,D.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1497-1502,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
2.

Conference Proceedings
Conference Proceedings
2. Oxygen Complexing with Group II Impurities in Silicon
Daly,S.E. ; McGlynn,E. ; Henry,M.O. ; Campion,J.D. ; McGuigan,K.G. ; DoCarmo,M.C. ; Nazare,M.H.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1303-1308,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
3.

Conference Proceedings
Conference Proceedings
3. Novel luminescent centres in cadmium doped silicon
Frehill,C.A. ; Henry,M.O. ; McGlynn,E. ; Daly,S.E. ; Deicher,M. ; Magerle,R. ; McGuigan,K.G. ; Safanov,A.N. ; Lightowlers,E.C.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.521-526,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263