1.

Conference Proceedings
Conference Proceedings
1. New Nanocrystalline Si Floating Gate Structure for Nonvolatile Memory Application
Wu, L.C. ; Shi, J.J. ; Chen, K.J. ; Xu, J. ; Li, W. ; Ma, Z.Y. ; Dai, M. ; Wu, D. ; Li, A.D. ; Huang, X.F.
Pub. info.: Quantum confined semiconductor nanostructures : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A..  pp.425-860,  2003.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 737
2.

Conference Proceedings
Conference Proceedings
2. Structural characterization and Coulomb blockade of a-SiNx/ nanocrystalline Si /a-SiNx asymmetric double-barrier structures
Wu, L. C. ; Dai, M. ; Huang, X. F. ; Han, P. G. ; Yu, L. W. ; Zou, H. C. ; Li, W. ; Chen, K. J.
Pub. info.: Group-IV semiconductor nanostructures : symposium held November 29-December 2, 2004, Boston, Massachusetts, U.S.A..  pp.45-50,  2005.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 832
3.

Conference Proceedings
Conference Proceedings
3. Room Temperature Resonant Tunneling and Coulomb Blockade In Nanocrystalline Si With Double SiO2 Barriers
Wu, L.C. ; Chen, K.J. ; Dai, M. ; Li, W. ; Yu, L.W. ; Huang, X.F.
Pub. info.: Self-organized processes in semiconductor heteroepitaxy : symposium held December 1-5, 2003, Boston, Massachusetts, U.S.A..  pp.89-94,  2004.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 794
4.

Conference Proceedings
Conference Proceedings
4. Auto-calibration: new method and comparisons
Wu, Y. ; Shen, J. ; Dai, M.
Pub. info.: Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology II.  pp.179-187,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5606
5.

Conference Proceedings
Conference Proceedings
5. In situ infrared absorption spectroscopy for thin film growth by atomic layer deposition (Invited Paper) [6325-16]
Wang, Y. ; Dai, M. ; Rivilon, S. ; Ho, M.-T. ; Chabal, Y. J.
Pub. info.: Physical Chemistry of Interfaces and Nanomaterials V.  pp.63250G-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6325